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Trak Charged Particle Toolkit是計算機平臺上用于帶電粒子光學(xué)和離子槍設(shè)計的2D代碼。該程序應(yīng)用高精度有限元技術(shù)來計算單粒子軌道或模擬二維（平面或圓柱）電場和磁場中的穩(wěn)態(tài)光束。特征包括束產(chǎn)生的電場和磁場的影響、輸入分布的自動生成、自洽空間電荷限制發(fā)射和場發(fā)射。應(yīng)用包括電子和離子槍、電光器件、電子顯微鏡、真空微電子和相對論高功率光束。該軟件包包括五個組件：網(wǎng)格（自動創(chuàng)建等角三角形網(wǎng)格），EStat（電場解、繪圖和分析）、PerMag（磁場解、繪圖和分析）和Trak（計算軌跡和再生場、繪圖和分析）和GenDist（粒子分布繪圖和分析）。
特征：
結(jié)合來自獨立網(wǎng)格的計算電場和磁場的影響
來自多個來源的自洽空間電荷限制發(fā)射
高精度軌道計算，即使在電極表面附近也能
準(zhǔn)確插值到停止平面以進行鏡頭表征
具有內(nèi)置硬拷貝支持的交互式軌道和場繪圖后處理
自動計算用于離子提取的自洽等離子體表面
二次發(fā)射模型和多代電子歷史的自動跟蹤
自動計算發(fā)射率和電流密度
格式化的文本輸出文件可以輕松地將信息傳輸?shù)接脩魬?yīng)用程序或數(shù)學(xué)分析程序
【英文介紹】
The Trak Charged Particle Toolkit is the most advanced 2D code available on any computer platform for charged-particle optics and gun design. The program applies high-accuracy finite-element techniques to calculate single-particle orbits or to simulate steady-state beams in 2D (planar or cylindrical) electric and magnetic fields. Features include effects of beam-generated electric and magnetic fields, automatic generation of input distributions, self-consistent space-charge-limited emission, and field emission. Applications include electron and ion guns, electro-optical devices, electron microscopes, vacuum microelectronics and relativistic high-power beams. The package includes five linked components: Mesh (automatically create conformal triangular meshes), EStat (electric-field solutions, plots and analysis), PerMag (magnetic-field solutions, plots and analysis) and Trak (calculate trajectories and regenerate fields, plots and analysis) and GenDist (plots and analysis of particle distributions).
Features
Combine effects of calculated electric and magnetic fields from independent meshes
Self-consistent space-charge-limited emission from multiple sources
High accuracy orbit calculations, even near electrode surfaces
Precision interpolation to stopping planes for lens characterization
Interactive orbit and field plotting postprocessor with built-in hardcopy support
Automatic calculation of self-consistent plasma surfaces for ion extraction
Advanced secondary- emission models and automatic tracking of multi-generational electron histories
Automatic calculations of emittance and current density
Formatted text output files make it easy to transfer information to user applications or to mathematical analysis programs
